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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
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Related Experiment Video

Updated: Jul 23, 2025

Fixed Target Serial Data Collection at Diamond Light Source
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Published on: February 26, 2021

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A standard descriptor for fixed-target serial crystallography.

Robin L Owen1, Daniele de Sanctis2, Arwen R Pearson3

  • 1Diamond Light Source, Harwell Science and Innovation Campus, Didcot OX11 0DE, United Kingdom.

Acta Crystallographica. Section D, Structural Biology
|July 18, 2023
PubMed
Summary
This summary is machine-generated.

A new standardized descriptor, not a device, is proposed to describe fixed targets for serial crystallography. This innovation aims to simplify data collection and enhance the exchange of fixed targets between synchrotron and X-ray free-electron laser (XFEL) sources.

Keywords:
fixed targetsserial crystallographystandardization

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Area of Science:

  • Crystallography
  • Structural Biology
  • X-ray Science

Background:

  • Fixed-target crystallography is crucial for serial crystallography at synchrotron and X-ray free-electron laser (XFEL) sources.
  • A wide variety of fixed targets exist, lacking standardization in design and dimensions.
  • The diversity of experimental needs makes a universal standard device impractical.

Purpose of the Study:

  • To propose a standardized descriptor for fixed targets in serial crystallography.
  • To facilitate data collection and the exchange of fixed targets between different facilities.
  • To improve compatibility and usability of fixed targets across various experimental setups.

Main Methods:

  • Development of a standardized descriptor in dictionary format.
  • The descriptor is designed to be readable by fixed-target beamline software.
  • The descriptor facilitates straightforward data collection from new fixed targets.

Main Results:

  • A simple, standardized descriptor is proposed as an alternative to a standardized device.
  • This descriptor enables beamline software to interpret and utilize new fixed targets.
  • Facilitates easier exchange and adoption of fixed targets across different sources.

Conclusions:

  • The proposed descriptor simplifies the integration of diverse fixed targets into serial crystallography workflows.
  • It enhances interoperability between different synchrotron and XFEL facilities.
  • This standardization benefits beamlines, researchers, and manufacturers by streamlining experimental setup and data acquisition.