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Updated: Jul 23, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
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Scanning ion conductance microscope with a capacitance-compensated current source amplifier

Kenta Nakazawa1, Teruki Tsukamoto1, Futoshi Iwata1,2,3

  • 1Graduate School of Integrated Science and Technology, Shizuoka University, 3-5-1 Johoku, Naka-ku, Hamamatsu 432-8561, Japan.

The Review of Scientific Instruments
|July 19, 2023
PubMed

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