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Scanning Probe Microscopy controller with advanced sampling support

Miroslav Valtr1,2, Petr Klapetek1,2, Jan Martinek1

  • 1Czech Metrology Institute, Okružní 31, 638 00 Brno, Czech Republic.

Hardwarex
|July 27, 2023
PubMed

Keywords:
Adaptive samplingField programmable gate arrayScanning probe microscopy

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