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Updated: Jul 20, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Safaa I Abd Elrahman1, Ahmed M Elkhawaga2, Amr H Hussein2,3
1Electronics and Communication Engineering Department, Faculty of Engineering, Zagazig University, Zagazig 44519, Egypt.
This study introduces two sector beam scanning approaches (BSAs) using element position perturbations (EPPs). A novel SLL/EPP-BSA method significantly reduces side lobe levels for enhanced antenna array performance.
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