Bonding in Metals
Electrodeposition
Bonding and Strength of Aggregate
Metal-Ligand Bonds
Ionic Bonds
Biasing of Metal-Semiconductor Junctions
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jul 18, 2025

In Situ Lithiated Reference Electrode: Four Electrode Design for In-operando Impedance Spectroscopy
Published on: September 12, 2018
Hongliang Zhou1, Andong Chang1, Junling Fan2
1School of Mechanical and Power Engineering, Henan Polytechnic University, Jiaozuo 454000, China.
This review covers copper (Cu) wire bonding, detailing wire types, Free Air Ball (FAB) morphology impacts, and reliability factors like intermetallic compounds and corrosion. It also explores simulation applications and future research directions for Cu wire bonding technology.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: