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Analysis of SEC-SAXS data via EFA deconvolution and Scatter
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KSEMAW: an open source software for the analysis of spectrophotometric, ellipsometric and photothermal deflection

Marco Montecchi1, Alberto Mittiga1, Claudia Malerba1

  • 1Energy Technologies and Renewable Sources Department, ENEA Research Center Casaccia, Roma, 00123, Italy.

Open Research Europe
|August 30, 2023
PubMed

Keywords:
complex refractive indexellipsometric measurementsfilm thicknessopen source softwareoptical characterizationspectrophotometric measurementsthin film

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