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Updated: Jul 16, 2025

Characterization of Thermal Transport in One-dimensional Solid Materials
Published on: January 26, 2014
Electron thermalization length in solid para-hydrogen at low-temperature
A F Borghesani1, G Carugno2, G Messineo3
1CNISM Unit, Department of Physics and Astronomy, Università degli Studi di Padova and Istituto Nazionale Fisica Nucleare, Sez. Padova, Padova, Italy.
Abstract:
We report the first ever measurements of the thermalization length of low-energy electrons injected into solid para-hydrogen at a temperature T ≈ 2.8 K. The use of the pulsed Townsend photoinjection technique has allowed us to investigate the behavior of quasi-free electrons rather than of massive, slow negative charges, as reported in all previous literature. We have found an average thermalization length ⟨z0⟩ = 26.1 nm, which is three to five times longer than that in liquid helium at the same temperature.
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