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Automated tilt compensation in acoustic microscopy.
Shubham Kumar Gupta1, Anowarul Habib2, Prakhar Kumar3
1Department of Chemical Engineering, Indian Institute of Technology, Guwahati, India.
Journal of Microscopy
|September 12, 2023
Summary
This study introduces an automated method to correct time-of-flight shifts in Scanning Acoustic Microscopy (SAM) caused by sample tilt. The new curve fitting technique enhances the accuracy of 3D imaging by precisely compensating for tilt-induced errors.
Area of Science:
- Materials Science
- Non-destructive Testing
- Acoustic Imaging
Background:
- Scanning Acoustic Microscopy (SAM) is a key non-destructive technique for 3D imaging.
- Accurate time-of-flight (ToF) measurements are crucial for SAM's precision.
- Sample or stage tilt introduces ToF shifts, compromising image accuracy.
Purpose of the Study:
- To develop an automated method for compensating ToF shifts in SAM caused by sample tilt.
- To improve the precision of topographic and tomographic profiles obtained from SAM.
- To offer an alternative to conventional manual methods for tilt compensation.
Main Methods:
- Proposed an automated tilt compensation technique for acoustic signals in SAM.
- Utilized a novel curve fitting method to correct ToF data.
- Did not require manual selection of coordinate points from time-domain data.
Main Results:
- Successfully compensated for time shifts in ToF data of a coin with varying tilt angles (6.67°, 12.65°, 15.95°).
- Achieved a time offset correction accuracy of 45 arcsec.
- Demonstrated the effectiveness of the automated method in improving SAM data accuracy.
Conclusions:
- The proposed automated tilt compensation method enhances the precision of SAM imaging.
- This technique offers a more efficient and accurate alternative to manual methods.
- The findings support the potential of this method for advanced SAM applications.

