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Noise robust Zernike phase retrieval via learning based algorithm only with 2-step phase shift measurements.

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    This study introduces a novel deep learning method for analyzing optical aberrations using only two phase shift measurements. The new 2-step approach demonstrates superior noise robustness and efficiency compared to existing 4-step techniques.

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    Area of Science:

    • Optical Engineering
    • Computational Optics
    • Machine Learning

    Background:

    • Aberration analysis is crucial for optical system performance.
    • Existing methods often require multiple measurements and are sensitive to noise.
    • Developing efficient and robust aberration analysis techniques is an ongoing challenge.

    Purpose of the Study:

    • To develop a noise-robust, deep learning-based aberration analysis method using 2-step phase shift data.
    • To create a realistic synthetic dataset for training deep neural networks.
    • To outperform existing 4-step iterative methods in accuracy and speed.

    Main Methods:

    • Proposed a realistic aberration pattern generation method using statistical distribution of Zernike coefficients.
    • Synthesized a large dataset (200,000 aberrations) for training.
    • Trained deep neural networks (GoogLeNet, ResNet101) on the synthetic dataset.
    • Evaluated the 2-step method against 4-step methods (derivative fitting, TIE, robust TIE).

    Main Results:

    • The 2-step deep learning method significantly outperformed 4-step methods in noise robustness, RMSE, and inference time for numerically generated aberrations.
    • Experimental validation showed comparable RMSE to 4-step methods for real-world aberrations.
    • Qualitative analysis revealed superior reconstruction of fringe patterns and phase distributions compared to existing methods.

    Conclusions:

    • The proposed 2-step deep learning method offers a practical and efficient approach for comprehensive aberration analysis.
    • The method exhibits excellent noise robustness and computational speed.
    • Potential for extension to higher-order aberrations and further performance improvements.