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An entropy-controlled objective chip for reflective confocal microscopy with subdiffraction-limit resolution.

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Planar diffractive lenses achieve super-resolution focusing by optimizing disordered structures. A new method balances imaging and focusing, enabling ultracompact microscopy for super-resolution imaging.

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Area of Science:

  • Optics
  • Nanotechnology
  • Microscopy

Background:

  • Planar diffractive lenses (PDLs) offer sub-diffraction-limit focusing but compromise wide-field imaging due to disordered structures.
  • Existing PDLs face limitations in microscopy applications because of destroyed wide-field imaging capabilities.

Purpose of the Study:

  • To introduce information entropy (S) as a metric to quantify PDL disorder.
  • To predict an equilibrium point balancing wide-field imaging (Strehl ratio) and sub-diffraction-limit focusing.
  • To design and fabricate a PDL objective chip demonstrating improved performance.

Main Methods:

  • Utilizing information entropy (S) to evaluate structural deviation from standard Fresnel zone plates.
  • Applying entropy change theory to determine an equilibrium point for optimal lens design.
  • Designing a PDL objective chip with a 1 mm focal length, optimized for the predicted equilibrium point.

Main Results:

  • A fabricated PDL chip achieved a sub-diffraction-limit focus size of 0.44λ.
  • Experimental imaging demonstrated resolution up to 4000 line pairs/mm.
  • The designed chip is the closest reported PDL to the theoretical equilibrium point.

Conclusions:

  • The developed information entropy approach effectively balances imaging and focusing capabilities in PDLs.
  • The fabricated PDL chip enables ultracompact reflective confocal microscopy for super-resolution imaging.
  • This work overcomes limitations of disordered structures in PDLs, expanding their potential in advanced imaging.