Assessing Local Electrical Properties of Ionic Liquid/Metal Interfaces with Operando-XPS and by Incorporating...

X-ray photoelectron spectroscopy (XPS) has been utilized to record binding energy changes upon applying direct current (DC) and/or alternating current (AC) (square-wave) bias with different frequencies on a coplanar capacitor, having an ionic liquid (IL) film as the electrolyte. Electrical potential developments in numerous locations on the device are extracted from the variations in binding energy positions of the atomic core levels, which together with electrochemical measurements are used to extract local information before and after insertion of additional resistors in series. The presence of the IL introduces complex charging/discharging processes with a direct influence on the electrical double layer (EDL) formation, some of which can be untangled from each other via AC modulation by choosing appropriate time windows of observation. Accordingly, under 10 kHz modulation, fast processes are sampled, which are associated with electronic currents, and effects of slow migratory currents can be measured using 0.1 Hz. The addition of serial resistors allows us to quantify AC currents passing through, which reveals the magnitude of the system's impedance under different conditions. This process surprisingly reverses differences(s) in the voltage developments between the low and high frequencies over the electrified electrodes compared to those over the porous membrane in between. Our approach turns XPS into a powerful electrical and surface-sensitive tool for extracting localized electrochemical properties in a noninvasive and direct way. We expect that a wider utilization of the technique will lead to better identification of the obstacles for developing the next-generation sensing, energy harvesting, and storage systems as well as devices for iontronic/neuromorphic applications.