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Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
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Preparation of Nanoparticles for ToF-SIMS and XPS Analysis

Published on: September 13, 2020

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A simple equation to determine the shell thicknesses of core-shell nanoparticles based on XPS data of their elemental

Alexey T Kozakov1, Anton A Skriabin1, Niranjan Kumar2

  • 1Research Institute of Physics, Southern Federal University, Stachki Ave. 194, Rostov-on-Don 344090, Russia. atkozakov@sfedu.ru.

Physical Chemistry Chemical Physics : PCCP
|October 2, 2023
PubMed

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