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In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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Research on crack propagation behaviour of EB-PVD TBCs based on TGO evolution

Lulu Wang1,2, Jinying Zhan2,3, Yankuan Liu4

  • 1Shenyang University of Technology, Shenyang, 110870, China.

Scientific Reports
|October 16, 2023
PubMed

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