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Very low excess noise Al0.75Ga0.25As0.56Sb0.44 avalanche photodiode
Optics Express
|October 20, 2023
Summary
This study reveals lower excess noise in AlGaAsSb avalanche photodiodes (APDs) at high multiplication, achieving record low noise for III-V APDs. These findings advance APD design and high-field device applications.
Area of Science:
- Semiconductor Physics
- Optoelectronics
- Materials Science
Background:
- AlxGai-xAsySb1-y on InP is researched for low-noise, high-sensitivity avalanche photodiodes (APDs).
- Previous work focused on high Al concentrations (x >= 0.85).
Purpose of the Study:
- To investigate AlGaAsSb with lower Al concentrations for improved APD performance.
- To determine impact ionization coefficients and excess noise in Al0.75Ga0.25As0.56Sb0.44.
Main Methods:
- Fabrication and characterization of complementary p-i-n and n-i-p diode structures.
- Measurement of avalanche multiplication and excess noise over a wide electric field range (up to 650 kV/cm).
Main Results:
- Achieved excess noise factor (F=2.4) at high multiplication (M=90) in Al0.75Ga0.25As0.56Sb0.44.
- Determined electron and hole impact ionization coefficients.
- Observed excess noise significantly lower than predicted by conventional McIntyre theory.
Conclusions:
- AlGaAsSb with lower Al concentrations offers superior low-noise performance in APDs.
- Results challenge existing noise theories and have implications for high-field devices beyond APDs.
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