Overview of Microscopy Techniques
Atomic Force Microscopy
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Updated: Jul 11, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Zhousheng Chen1,2,3, Zhe Ding1,4, Mengqi Wang1,2
1CAS Key Laboratory of Microscale Magnetic Resonance and School of Physical Sciences, University of Science and Technology of China, Hefei 230026, China.
We designed a versatile scanning probe microscope using nitrogen-vacancy centers in diamond for sensitive magnetic sensing. This robust instrument operates across wide temperature and vacuum ranges, enabling advanced nanomagnetism and spintronics research.
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