Anomaly Detection in the Production Process of Stamping Progressive Dies Using the Shape- and Size-Adaptive...

In the production process of progressive die stamping, anomaly detection is essential for ensuring the safety of expensive dies and the continuous stability of the production process. Early monitoring processes involve manually inspecting the quality of post-production products to infer whether there are anomalies in the production process, or using some sensors to monitor some state signals during the production process. However, the former is an extremely tedious and time-consuming task, and the latter cannot provide warnings before anomalies occur. Both methods can only detect anomalies after they have occurred, which usually means that damage to the die has already been caused. In this paper, we propose a machine-vision-based method for real-time anomaly detection in the production of progressive die stamping. This method can detect anomalies before they cause actual damage to the mold, thereby stopping the machine and protecting the mold and machine. In the proposed method, a whole continuous motion scene cycle is decomposed into a standard background template library, and the potential anomaly regions in the image to be detected are determined according to the difference from the background template library. Finally, the shape- and size-adaptive descriptors of these regions and corresponding reference regions are extracted and compared to determine the actual anomaly regions. The experimental results indicate that this method can achieve reasonable accuracy in the detection of anomalies in the production process of stamping progressive dies. The experimental results demonstrate that this method not only achieves satisfactory accuracy in anomaly detection during the production of progressive die stamping, but also attains competitive performance levels when compared with methods based on deep learning. Furthermore, it requires simpler preliminary preparations and does not necessitate the adoption of the deep learning paradigm.