In-situ TEM study from the perspective of holders

Toshie Yaguchi1, Mia L San Gabriel2, Ayako Hashimoto3,4

  • 1Electron Microscope Systems Design Department, Hitachi High-Tech Corporation, 552-53 Shinko-cho, Hitachinaka-shi, Ibaraki-ken 312-8504, Japan.

PubMed