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Aberration Estimation for Synthetic Aperture Digital Holographic Microscope Using Deep Neural Network.

Hosung Jeon1, Minwoo Jung1, Gunhee Lee1

  • 1School of Electronic and Electrical Engineering, Kyungpook National University, Daegu 41566, Republic of Korea.

Sensors (Basel, Switzerland)
|November 25, 2023
PubMed
Summary
This summary is machine-generated.

This study introduces deep neural networks (DNNs) to correct aberrations in synthetic aperture digital holographic microscopy (SA-DHM). The novel method enhances image resolution and quality, overcoming limitations of traditional microscopy techniques.

Keywords:
aberration estimationdeep neural networkholographic microscopesynthetic aperture

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Area of Science:

  • Optical microscopy
  • Computational imaging
  • Biophysics

Background:

  • Digital holographic microscopy (DHM) measures sample optical properties via diffracted beams.
  • Lagrange invariance in DHM limits spatial bandwidth product (SBP), affecting resolution and field of view.
  • Synthetic aperture DHM (SA-DHM) aims to overcome SBP limitations but suffers from aberrations.

Purpose of the Study:

  • To propose a novel approach using deep neural networks (DNNs) for aberration compensation in SA-DHM.
  • To extend aberration compensation beyond the objective lens's numerical aperture (NA).
  • To improve the resolution and image quality of SA-DHM.

Main Methods:

  • Training a DNN using diffraction patterns and Zernike coefficients obtained through a circular aperture.
  • Estimating aberration coefficients from a partial diffracted beam masked by a circular aperture.
  • Implementing DNN-based aberration compensation in the illumination beam of SA-DHM.

Main Results:

  • Effective compensation of aberrations in the illumination beam of SA-DHM.
  • Demonstrated improvement in the resolution and quality of sample images via simulations.
  • Successful estimation of aberration coefficients from limited diffracted beam information.

Conclusions:

  • Deep neural networks offer a powerful tool for aberration correction in SA-DHM.
  • The proposed method significantly enhances SA-DHM performance, overcoming prior limitations.
  • This integration promises advancements in microscopy for broader scientific applications.