Pixel-wise beam-hardening correction for dark-field signal in X-ray dual-phase grating interferometry

The dark-field signal provided by X-ray grating interferometry is an invaluable tool for providing structural information beyond the direct spatial resolution and their variations on a macroscopic scale. However, when using a polychromatic source, the beam-hardening effect in the dark-field signal makes the quantitative sub-resolution structural information inaccessible. Especially, the beam-hardening effect in dual-phase grating interferometry varies with spatial location, inter-grating distance, and diffraction order. In this work, we propose a beam-hardening correction algorithm, taking into account all these factors. The accuracy and robustness of the algorithm are then validated by experimental results. This work contributes a necessary step toward accessing small-angle scattering structural information in dual-phase grating interferometry.