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Improving model-data mismatch for photon-counting detector model using global and local model parameters.

Donghyeon Lee1, Xiaohui Zhan2, W Yang Tai3

  • 1The Russell H. Morgan Department of Radiology and Radiological Science, Johns Hopkins University School of Medicine, Baltimore, Maryland, USA.

Medical Physics
|December 8, 2023
PubMed
Summary

This study introduces an improved photon counting detector (PCD) model with count-rate-dependent parameters to accurately characterize X-ray spectra, addressing limitations of previous models for better clinical applications.

Keywords:
charge sharingcomputed tomographyphoton counting detectorspulse pileup

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Area of Science:

  • Medical Imaging Physics
  • Detector Technology
  • Computational Modeling

Background:

  • Photon counting detectors (PCDs) offer clinical advantages but their energy-discriminating capability is degraded by charge sharing and pulse pileup, distorting X-ray spectra.
  • Existing PCD output models show agreement but suffer from global model-data mismatch and pixel-to-pixel variations.

Purpose of the Study:

  • To improve PCD modeling by incorporating count-rate-dependent parameters to address model-data mismatch and pixel variations.
  • To evaluate the accuracy of the enhanced PCD model against physical detectors.

Main Methods:

  • A cascaded model was adapted with condition-dependent and pixel-specific parameters to mitigate discrepancies.
  • Model parameters were estimated using data from varying phantom thicknesses and X-ray tube currents.
  • Performance was validated using CdZnTe-based PCDs, comparing models with default, global, and global-and-local parameters via Mean Absolute Percentage Errors (MAPEs).

Main Results:

  • The proposed model demonstrated strong visual agreement with PCD measurements across various count rates.
  • MAPEs were significantly reduced: 49.2-51.1% (default), 8.0-9.8% (global), and 1.2-2.7% (global-and-local parameters).

Conclusions:

  • The enhanced PCD model accurately estimates detector outputs from low to high count rates.
  • This model is expected to be valuable in applications requiring precise pixel-by-pixel PCD characterization.