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Sub-micrometer four-point probe transport measurements on graphene
K Vonk1, J D Verbakel1, R Huijink2
1Physics of Interfaces and Nanomaterials, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands.
The Review of Scientific Instruments
|December 8, 2023
Summary
Researchers developed a new method for measuring electronic transport in graphene using a collinear micro-four-point probe. This technique avoids the need for fabricating electrodes on the material, simplifying measurements on small graphene flakes.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Nanotechnology
Background:
- Electronic transport measurements in 2D materials like graphene typically require fabricating electrodes.
- Conventional methods, such as Hall bar devices, involve complex deposition processes.
Purpose of the Study:
- To demonstrate a simplified method for electrical transport measurements on small graphene flakes.
- To eliminate the need for pre-patterned electrodes on the 2D material.
Main Methods:
- Utilized a collinear micro-four-point probe with sub-micrometer probe pitches.
- Performed back-gate tuned transport measurements on graphene flakes on silicon oxide and hexagonal boron nitride substrates.
Main Results:
- Successfully conducted electrical transport measurements without on-flake electrode fabrication.
- Obtained charge carrier mobilities and minimum conductivity values consistent with conventional methods.
- Assessed potential substrate damage from probe contact.
Conclusions:
- The micro-four-point probe method offers a viable, electrode-free alternative for graphene transport characterization.
- This technique simplifies measurements, especially for small-area 2D material samples.
- Further investigation into probe-induced damage is warranted for precise material analysis.
