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Updated: Jul 9, 2025

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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
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X-ray self-emission imaging with spherically bent Bragg crystals on the Z-machine
E C Harding1, G K Robertson1, G S Dunham1
1Sandia National Laboratories, Albuquerque, New Mexico 87185, USA.
The Review of Scientific Instruments
|December 8, 2023
Summary
A new X-ray imaging system using bent crystals was developed for Magnetized Liner Inertial Fusion (MagLIF) experiments. This diagnostic achieves 18 µm resolution, enabling detailed imaging of plasma structures.
Area of Science:
- Plasma Physics
- X-ray Optics
- Fusion Energy Research
Background:
- Magnetized Liner Inertial Fusion (MagLIF) generates hot, dense plasma emitting X-rays.
- Accurate imaging of plasma dynamics is crucial for understanding MagLIF performance.
- Existing X-ray diagnostics may lack the required resolution or field-of-view.
Purpose of the Study:
- To implement and evaluate an X-ray imaging scheme using spherically bent crystals for MagLIF targets.
- To achieve high spatial resolution for detailed analysis of plasma structures.
- To assess the diagnostic's capability in resolving radial features within the plasma column.
Main Methods:
- Utilized a spherically bent crystal optic to capture X-ray emission from MagLIF plasma.
- Employed a limiting aperture on the Rowland circle to define a narrow spectral range (<15 eV).
- Measured average spatial resolution in the highest resolution configuration.
Main Results:
- Achieved an average spatial resolution of 18 µm.
- Successfully imaged the entire one-cm length of the plasma column with high throughput and large field-of-view.
- Clearly resolved radial structures, including bifurcations, within the plasma stagnation column.
Conclusions:
- The spherically bent crystal X-ray imager is effective for diagnosing MagLIF plasmas.
- The achieved resolution allows for accurate determination of radial plasma size and structure.
- The success has led to the development of a two-crystal configuration for spectral line emission analysis.
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