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Updated: Jul 9, 2025

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
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Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories

Johanna Marin Carbonne1, Andras Kiss2,3, Anne-Sophie Bouvier4

  • 1Earth Sciences Institute, University of Lausanne, Geopolis Mouline, CH 1015 Lausanne. johanna.marincarbonne@unil.ch.

Chimia
|December 9, 2023
PubMed

Keywords:
BiologyEarth sciencesMass spectrometryNanoSIMSSIMSSurface analysisTOF-SIMS

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