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Published on: May 27, 2020
Negative diffusion of excitons in quasi-two-dimensional systems
Aleksandr A Kurilovich1, Vladimir N Mantsevich2, Aleksei V Chechkin3,4,5
1Center for Energy Science and Technology, Skolkovo Institute of Science and Technology, Bolshoy Boulevard 30, 121205, Moscow, Russia.
Negative diffusion in semiconductors arises from excitons initially trapped and then slowly released, creating an apparent backward movement. This phenomenon is observed in quasi-two-dimensional systems and influenced by recombination and exciton interactions.
Area of Science:
- Condensed matter physics
- Semiconductor physics
- Exciton dynamics
Background:
- Negative diffusion of excitons has been experimentally observed in quasi-two-dimensional semiconductor systems.
- This phenomenon challenges conventional diffusion models and requires explanation through advanced theoretical frameworks.
Purpose of the Study:
- To explain the observed negative diffusion of excitons using mobile-immobile type models.
- To elucidate the underlying mechanisms causing the apparent backward movement of excitons.
Main Methods:
- Utilized two distinct mobile-immobile theoretical models.
- Analyzed experimental data from quasi-two-dimensional semiconductor systems.
Main Results:
- The models successfully explain negative diffusion as a result of initial exciton trapping and delayed release.
- The observed narrowing of exciton density profiles and decreased mean-squared displacement are attributed to this trapping-release mechanism.
- Negative diffusion is enhanced by increased recombination intensity and exciton-exciton binary interaction rates.
Conclusions:
- The mobile-immobile model provides a robust explanation for negative exciton diffusion in semiconductors.
- Experimental observations of negative diffusion are a consequence of exciton trapping dynamics rather than true backward diffusion.
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