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A New Insight on the "S" Shape Pattern of Soft Faults in Time-Domain Reflectometry
1GeePs, Group of Electrical Engineering Paris, CNRS, CentraleSupélec, Université Paris-Saclay, 3 & 11 Rue Joliot-Curie, 91192 Gif-sur-Yvette, France.
Abstract:
This paper proposes a new interpretation of the commonly observed, very specific, time-domain response associated with a soft defect in an electrical line under test using time-domain reflectometry. The reflectometry reveals the nature of a defect by analyzing the reflections undergone by an injected pulse at the impedance discontinuities present on the line. The faulty section considered in this work is modeled as a local modification of the characteristic impedance. Using the developed model, we explain how, depending on the physical and electrical characteristics of the faulty section, the associated signature yields a very specific "S"-shaped pattern. The influence of the probing signal is also investigated. Finally, it is shown that the amplitude of the reflected signal cannot be interpreted straightforwardly as a mirror of the severity of the defect and that consequently, small echoes can mask more significant defects.
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