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A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
Guangjian Wu1,2,3, Xumeng Zhang1,2,3, Guangdi Feng4
1State Key Laboratory of Integrated Chips and Systems, Frontier Institute of Chip and System, Fudan University, Shanghai, China.
No abstract available in PubMed .