Carrier Transport
Metal-Semiconductor Junctions
Transmission Electron Microscopy
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Updated: Jul 6, 2025

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
This study addresses spectral distortion in Broadband Coherent Anti-Stokes Raman Scattering (BCARS) spectroscopy for crystalline materials. We assessed reproducibility and optimized setup parameters for accurate non-resonant background correction and spectral analysis.
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