Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Cloning and functional verification of genes LjHD8 and LjMIXTA1 related to trichome development in Lonicera japonica Thunb.

Planta·2026

Same author

Insights into Cationic Vacancies in a Prussian Blue Analogues Cathode for Enhanced Reversible Sodium Insertion.

JACS Au·2026

Same author

Whole genome identification and operational analysis of the <i>bHLH</i> gene family in longan and the role of <i>DlbHLH8</i> in flowering regulation.

Frontiers in plant science·2026

Same author

Grating parameter characterization based on the combination of dark field geometry-guidance and model-assisted interferometric processing.

Optics express·2026

Same author

Cellulose Nanofibril-Stabilized Porous CaCO<sub>3</sub> Synergistic System for Simultaneous Deacidification and Reinforcement of Aging Paper Archives.

Langmuir : the ACS journal of surfaces and colloids·2026

Same author

Online health information seeking, healthcare utilization, and exercise-related self-management among patients with long-term conditions in China during COVID-19.

Digital health·2026

Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026

Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026

Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026

Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026

Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026

Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026

See all related articles

Search research articles

Related Experiment Video

Updated: Jul 6, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Aspherical interferometric probe with wave-plate-array detection: system design and nonlinearity analysis.

Xinrui Fan, Xiaofei Diao, Jianwei Wu

|January 4, 2024

Summary

This summary is machine-generated.

This study presents a novel interferometric probe for precise aspheric surface metrology. The developed nonlinear models accurately predict measurement errors caused by alignment deviations, enabling improved accuracy.

More Related Videos

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

An Experimental Protocol for Assessing the Performance of New Ultrasound Probes Based on CMUT Technology in Application to Brain Imaging

An Experimental Protocol for Assessing the Performance of New Ultrasound Probes Based on CMUT Technology in Application to Brain Imaging

Published on: September 24, 2017

Related Experiment Videos

Last Updated: Jul 6, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

An Experimental Protocol for Assessing the Performance of New Ultrasound Probes Based on CMUT Technology in Application to Brain Imaging

An Experimental Protocol for Assessing the Performance of New Ultrasound Probes Based on CMUT Technology in Application to Brain Imaging

Published on: September 24, 2017

Area of Science:

Optical Engineering
Surface Metrology
Precision Measurement

Background:

Optical probes are crucial for high-precision surface metrology.
Increasing surface complexity demands greater probe flexibility and range of motion.
Existing methods face challenges in measuring complex aspheric surfaces accurately.

Purpose of the Study:

To introduce an advanced interferometric probe for measuring aspheric surfaces.
To develop comprehensive nonlinear models for predicting measurement errors.
To validate the models through simulations and experiments.

Main Methods:

Design of an interferometric probe with a wave-plate-array detector and integrated splitter elements.
Development of nonlinear models based on Jones matrix theory to analyze alignment errors.
Conducting numerical simulations and optical experiments for model validation.

Main Results:

The integrated probe design enhances dynamic scanning performance and measurement precision.
Nonlinear models accurately capture errors stemming from alignment deviations.
A 10° alignment error was shown to induce a maximum nonlinear error of 3.02 nm.

Conclusions:

The developed models effectively predict nonlinear errors caused by alignment inaccuracies in optical probes.
This research provides a theoretical basis for reducing and compensating for measurement errors.
The novel probe design offers improved capabilities for complex surface metrology.