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Published on: October 5, 2013
Investigation of structural and reflective characteristics of short-period Mo/B4C multilayer X-ray mirrors
Roman Shaposhnikov1, Vladimir Polkovnikov1, Sergey Garakhin1
1The Institute for Physics of Microstructures of the Russian Academy of Sciences, Academicheskaya, Nizhny Novgorod 603087, Russian Federation.
Abstract:
The results of a study of the structural and reflective characteristics of short-period multilayer X-ray mirrors based on Mo/B4C at wavelengths 1.54 Å, 9.89 Å and 17.59 Å are presented. The period of the samples varied in the range 8-35 Å. The average widths of the interfaces were ∼3.5 and 2.2 Å at one and the other boundaries, with a tendency for weak growth with any decrease in the period. The interlayer roughness was ∼1 Å. The research results indicate promising prospects for the use of multilayer Mo/B4C mirrors for synchrotron applications.

