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Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet VUV Synchrotron Radiation
Published on: October 30, 2012
Robust unfolding of MeV x-ray spectra from filter stack spectrometer data.
C-S Wong1, J Strehlow1, D P Broughton1
1Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA.
We developed a new method to unfold MeV x-ray spectra from filter stack spectrometer (FSS) data. This robust technique accurately recovers large-scale spectral features without needing prior spectral information.
Area of Science:
- Nuclear Physics
- Plasma Physics
- Spectroscopy
Background:
- Filter stack spectrometers (FSS) are used to measure MeV x-ray spectra.
- Previous inversion methods often require a priori spectral shape assumptions or arbitrary algorithm termination.
- The perturbative minimization (PM) algorithm has limitations with non-monotonic attenuation coefficients.
Purpose of the Study:
- To present a novel inversion method for robustly unfolding MeV x-ray spectra from FSS data.
- To improve upon existing PM algorithms by removing the need for spectral shape specification or arbitrary termination.
- To enable accurate spectral recovery without requiring a physics model for initial guesses or fitting.
Main Methods:
- The developed method is based on the perturbative minimization (PM) algorithm.
- Improvements include regular smoothing of the candidate spectrum and addition of stochasticity to the search.
- The only assumption is that the x-ray spectrum is near a smooth curve.
Main Results:
- The inversion method successfully recovers primary large-scale features of MeV x-ray spectra.
- Accuracy for broad energy bins (several MeV) is within 10% for synthetic data.
- Fine-scale spectral features are more challenging to recover accurately.
Conclusions:
- The new inversion method provides a robust approach for unfolding MeV x-ray spectra from FSS data.
- It overcomes limitations of previous methods by not requiring a priori spectral information or arbitrary termination.
- The method demonstrates successful application to experimental data from high-power laser facilities.
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