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Quantitative atomic cross section analysis by 4D-STEM and EELS.

Shahar Seifer1, Lothar Houben2, Michael Elbaum1

  • 1Chemical and Biological Physics, Weizmann Institute of Science, Rehovot, Israel.

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|February 15, 2024
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Summary
This summary is machine-generated.

This study uses 4-dimensional scanning transmission electron microscopy (4D-STEM) to determine atomic cross-section information in amorphous materials. New parameters, Zeta and eta, are introduced for material identification in biological specimens.

Keywords:
4D STEMBethe theoryInelastic cross sectionPlasmon scatteringZ-contrast transmission electron microscopy

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Amorphous materials lack long-range atomic order, making traditional diffraction methods challenging for structural analysis.
  • Extracting atomic-level information from amorphous specimens is crucial for understanding their properties and composition.

Purpose of the Study:

  • To demonstrate the utility of 4-dimensional scanning transmission electron microscopy (4D-STEM) for quantifying atomic cross-section information in amorphous materials.
  • To develop new parameters for material identification in amorphous specimens using electron microscopy.

Main Methods:

  • Utilized 4D-STEM to record diffraction patterns of amorphous carbon, silica, amorphous ice, and vitrified phosphate buffer solution with 200 keV electrons.
  • Acquired Electron Energy Loss Spectroscopy (EELS) data at various thicknesses and energies.
  • Employed a convolution model to decouple mixed elastic and inelastic scattering contributions.

Main Results:

  • Measured differential cross-sections for plasmon excitations follow a 1/θ² distribution, matching theoretical calculations for discrete dipole transitions.
  • Elastic scattering at higher angles follows a 1/θ³·⁷ dependence, linearly related to atomic number for light elements.
  • Introduced Zeta (elastic-to-inelastic scattering ratio) and eta (elastic coefficient divided by thickness) parameters for material characterization.

Conclusions:

  • 4D-STEM, combined with EELS, effectively extracts atomic cross-section data from amorphous materials.
  • The developed Zeta and eta parameters provide a means for identifying material classes in amorphous organic and biological specimens.
  • The findings offer a pathway for detailed compositional analysis of complex amorphous systems.