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Atomic Force Microscopy to Study the Physical Properties of Epidermal Cells of Live Arabidopsis Roots
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GaN atomic electric fields from a segmented STEM detector: Experiment and simulation

Tim Grieb1, Florian F Krause1, Thorsten Mehrtens1

  • 1Institute of Solid State Physics, University of Bremen, Bremen, Germany.

Journal of Microscopy
|February 19, 2024
PubMed

Keywords:
4D STEMCOMGaNcentre‐of‐masselectric fieldsmomentum‐resolved STEMsegmented STEM detector

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