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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jul 2, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Atomic Defect Quantification by Lateral Force Microscopy.

Yucheng Yang¹, Kaikui Xu¹, Luke N Holtzman²

¹Department of Aerospace and Mechanical Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States.

|February 22, 2024

Summary

This summary is machine-generated.

Lateral Force Microscopy (LFM) can now detect atomic defects in 2D materials, including insulators. This mechanical technique offers a precise way to map defects, advancing the understanding of 2D material properties.

Keywords:

Atomic Defect Characterization Methods Atomic Defects Atomic Force Microscopy Friction Hexagonal Boron Nitride Lateral Force Microscopy Transition Metal Dichalcogenides

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Last Updated: Jul 2, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Quantitative Hardness Measurement by Instrumented AFM-indentation

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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Area of Science:

Materials Science
Nanotechnology
Surface Science

Background:

Atomic defects in 2D materials significantly influence their electronic and optoelectronic properties.
Accurate nanoscale defect quantification is crucial for optimizing 2D material performance but remains challenging, especially for insulating materials.

Purpose of the Study:

To demonstrate Lateral Force Microscopy (LFM) as a viable technique for observing atomic defects in both semiconducting and insulating 2D materials.
To overcome limitations in current defect characterization methods for 2D materials.

Main Methods:

Enhanced LFM sensitivity by analyzing cantilever mechanics.
Applied LFM to map atomic-scale point defects on bulk Molybdenum Diselenide (MoSe2).
Correlated LFM findings with Conductive Atomic Force Microscopy (CAFM) measurements.

Main Results:

LFM successfully located atomic defects on bulk MoSe2 surfaces.
Direct comparison confirmed LFM-observed point defects correspond to actual atomic defects.
Demonstrated LFM's capability to characterize defects in insulating hexagonal boron nitride (hBN), including intrinsic and annealing-induced defects.

Conclusions:

LFM is a versatile mechanical technique for atomic defect characterization in diverse 2D materials, including insulators.
This method enables defect-property relationship studies without requiring conductive pathways.
The findings are expected to accelerate 2D materials research by facilitating routine defect analysis.