The IEEE TC-10 Standards: Update 2019

Area of Science:

• Instrumentation and Measurement
• Signal Processing
• Metrology

Background:

• Global need for standardized terminology and test methods for signal generating and waveform analyzing devices.
• Current lack of standardization hinders accurate, reproducible, and communicable device performance characterization.
• Standardization is essential for technological advancement, product comparison, and reliable calibration.

Purpose of the Study:

• To address the global need for standardization in waveform generation, measurement, and analysis.
• To outline the role of IEEE Technical Committee 10 (TC-10) in developing documentary standards.
• To present the current portfolio and development status of relevant IEEE standards.

Main Methods:

• Development and maintenance of documentary standards by IEEE TC-10.
• International collaboration among experts from metrology, industry, and academia.
• Review and description of published and draft IEEE standards related to waveform analysis.

Main Results:

• IEEE TC-10 has published several key standards (e.g., IEEE Std 181-2011, IEEE Std 1057-2017).
• Existing standards cover terminology and test methods for various devices like ADCs, DACs, and circuit probes.
• A new draft standard for Jitter and Phase Noise (IEEE Draft Std. P2414) is under development.

Conclusions:

• Standardization efforts by IEEE TC-10 are vital for ensuring reliable device performance characterization.
• Published standards facilitate clear communication, product comparison, and accurate calibration.
• Ongoing development of new standards, like P2414, addresses emerging needs in the field.