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Low-noise cryogenic microwave amplifier characterization with a calibrated noise source
M Malnou1,2, T F Q Larson1,2, J D Teufel1
1National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
The Review of Scientific Instruments
|March 7, 2024
Summary
Accurate noise characterization is crucial for parametric amplifiers in quantum computing. This study clarifies measurement and analysis methods, highlighting issues with loss and the idler mode for improved device development.
Area of Science:
- Quantum Computing
- Superconducting Devices
- Cryogenic Amplifiers
Background:
- Parametric amplifiers are essential for superconducting quantum computing.
- Inconsistent noise characterization methodologies hinder research and development.
- Understanding noise performance is critical for device optimization.
Purpose of the Study:
- To address inconsistencies in parametric amplifier noise characterization.
- To provide clear guidelines for measurement and analysis.
- To highlight specific challenges in noise performance evaluation.
Main Methods:
- Reviewing fundamental noise characterization concepts.
- Analyzing special problems in low-power parametric amplifiers.
- Illustrating issues with high-electron mobility transistor and Josephson parametric amplifiers.
- Utilizing a 50-Ω shot noise tunnel junction (SNTJ) as a broadband noise source.
Main Results:
- Identified common pitfalls in parametric amplifier noise measurement and interpretation.
- Demonstrated the utility of SNTJ for cryogenic amplifier noise characterization.
- Highlighted the impact of loss and the idler mode on noise performance.
Conclusions:
- Standardized noise characterization is vital for advancing parametric amplifier technology.
- Careful consideration of measurement details and analysis is necessary.
- The SNTJ offers a practical tool for accurate cryogenic noise measurements.
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