Computed Tomography
Imaging Studies I: CT and MRI
Electron Microscope Tomography and Single-particle Reconstruction
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Updated: Jul 1, 2025

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
Prashanth Jaganmohan1,2, Bala Muralikrishnan1, Meghan Shilling1
1Sensor Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
This study investigates geometric errors in X-ray computed tomography (XCT) systems, focusing on detector and rotation stage positioning for improved magnification and error sensitivity. Optimal placement enhances performance evaluation for industrial metrology.
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