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Unlocking stray light mysteries in the CoRot baffle with the time-of-flight method
L Clermont1, P Blain2, W Khaddour3
1Centre Spatial de Liège, STAR Institute, Université de Liège, Avenue du Pré-Aily, 4031, Liège, Belgium. lionel.clermont@uliege.be.
Scientific Reports
|March 15, 2024
Summary
The time-of-flight (ToF) method precisely identifies stray light sources in space telescopes. This technique successfully characterized scattering in a real space baffle, even detecting dust contamination, simplifying troubleshooting.
Area of Science:
- Optical Engineering
- Space Systems Engineering
- Astrophysics Instrumentation
Background:
- Stray light (SL) significantly limits space telescope performance.
- Current methods struggle to isolate and identify individual SL contributors.
- Troubleshooting SL issues often relies on inefficient trial-and-error processes.
Purpose of the Study:
- To apply and validate the time-of-flight (ToF) method for characterizing stray light in a complex space optical system.
- To differentiate intrinsic baffle stray light from experimental artifacts.
- To demonstrate the ToF method's capability in identifying specific SL sources and defects.
Main Methods:
- Utilized the time-of-flight (ToF) method with a pulsed laser and ultrafast sensor.
- Applied the ToF technique to the spare model of the CoRoT baffle.
- Measured individual stray light contributors over a dynamic range of 10^-11.
Main Results:
- Successfully measured individual stray light contributors in the CoRoT baffle model.
- Identified direct scattering on vane edges and two-step scattering paths.
- Differentiated intrinsic baffle stray light from experimental conditions, including air scattering, avoiding vacuum testing.
- Detected localized dust particles as a significant source of stray light.
Conclusions:
- The time-of-flight (ToF) method is effective for detailed stray light analysis in challenging space optical systems.
- ToF provides critical insights for defect identification and performance validation.
- This method reduces the need for costly and complex testing environments like vacuum chambers.
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