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Updated: Jun 29, 2025

Phase Contrast and Differential Interference Contrast DIC Microscopy
Published on: August 6, 2008
Application of Hilbert-differential phase contrast to scanning transmission electron microscopy
Haruka Iga1, Toshiki Shimizu1, Hiroki Minoda1
1Department of Applied Physics, Tokyo University of Agriculture and Technology, 2-24-16, Naka-cho, Koganei, Tokyo 184-8588, Japan.
Abstract:
We report a novel class of scanning transmission electron microscopy with Hilbert-differential phase contrast (HDP-STEM) that displays nanostructures of thin samples in a topographical manner. A semicircular π-phase plate (PP) was used as an optical device for manipulating electron waves in HDP-STEM. This is the different design from the Zernike PP used in our previous phase plate STEM (P-STEM), but both must be placed in the front focal plane of the condenser lens. HDP-STEM images of multiwalled carbon nanotubes showed higher contrast than those obtained by conventional bright-field STEM. As the PP of the HDP-STEM is nonsymmetrical, several different images were obtained by changing the detection conditions. A two-dimensional electron detector was also used to remove the scattering contrast component in the same way as with the Zernike PP and obtain an image containing only (differential) phase contrast.
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