Establishing a reference focal plane using convolutional neural networks and beads for brightfield imaging

Joe Chalfoun1, Steven P Lund2, Chenyi Ling2

  • 1National Institute of Standards and Technology, Gaithersburg, MD, USA. joe.chalfoun@nist.gov.

Scientific Reports
|April 2, 2024
PubMed
Summary

Accurate and repeatable microscopy measurements are challenging. This study introduces a novel method using control beads and a convolutional neural network (ResNet 18) to establish a reference effective focal plane (REFP), significantly improving measurement reliability across different microscopes.