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Updated: Jun 29, 2025

From Voxels to Knowledge: A Practical Guide to the Segmentation of Complex Electron Microscopy 3D-Data
Published on: August 13, 2014
Marek Franaszek1, Prem Rachakonda1, Kamel S Saidi1
1National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
This study introduces a novel filtering technique to remove outlier points from 3D data in robotic bin-picking. The new method significantly improves outlier removal efficacy in cluttered manufacturing scenes compared to existing procedures.
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