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Updated: Jun 29, 2025

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

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Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

Philipp Hönicke1, André Wählisch1, Rainer Unterumsberger1

  • 1Physikalisch-Technische Bundesanstalt (PTB) Abbestr. 2-12 D-10587 Berlin, Germany.

Nanotechnology
|April 5, 2024
PubMed

Keywords:
micro focussed XRFnanostructure characterizationreference-free analysisthin-film characterizationx-ray fluorescence

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