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Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

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Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which...
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X-ray Crystallography02:18

X-ray Crystallography

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
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X-ray Diffraction of Biological Samples01:10

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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
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Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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Atomic Absorption Spectroscopy: Radiation and Light Sources01:13

Atomic Absorption Spectroscopy: Radiation and Light Sources

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Atomic absorption spectroscopy (AAS) relies on the Beer-Lambert law, which requires that the radiation source emits a narrow range of wavelengths to match the absorption characteristics of the analyte atom. The primary criteria for choosing an appropriate radiation source in AAS is to provide a precise and intense emission at specific wavelengths that will allow accurate detection of the analyte.
Two common narrow-range 'line' sources used in AAS are hollow-cathode lamps (HCLs) and...
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Related Experiment Video

Updated: Jun 29, 2025

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

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Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam.

Philipp Hönicke1, André Wählisch1, Rainer Unterumsberger1

  • 1Physikalisch-Technische Bundesanstalt (PTB) Abbestr. 2-12 D-10587 Berlin, Germany.

Nanotechnology
|April 5, 2024
PubMed
Summary

This study introduces reference-free micro X-ray fluorescence (μXRF) analysis, eliminating the need for calibration standards. This advancement enables accurate, position-sensitive elemental composition analysis for microstructured samples without prior reference specimens.

Keywords:
micro focussed XRFnanostructure characterizationreference-free analysisthin-film characterizationx-ray fluorescence

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Micro X-ray fluorescence (μXRF) is crucial for analyzing lateral composition in microstructured samples.
  • Quantitative μXRF analysis traditionally requires calibration or reference specimens.
  • Existing methods limit the widespread application of μXRF for quantitative elemental mapping.

Purpose of the Study:

  • To extend the reference-free X-ray fluorescence (XRF) approach to micro X-ray fluorescence (μXRF) analysis.
  • To enable quantitative and position-sensitive elemental composition analysis without calibration standards.
  • To demonstrate the applicability of reference-free μXRF in complex sample analysis.

Main Methods:

  • Development and explanation of instrumental steps for reference-free μXRF.
  • Validation of reference-free μXRF against standard XRF using laterally homogeneous samples.
  • Application of reference-free μXRF to a semiconductor research sample with complex lateral features.

Main Results:

  • Successful implementation of reference-free μXRF analysis.
  • Demonstrated accuracy of reference-free μXRF by comparison with standard XRF.
  • Quantitative elemental composition mapping achieved for a challenging semiconductor sample.

Conclusions:

  • Reference-free μXRF significantly broadens the applicability of quantitative elemental analysis for microstructured materials.
  • This method removes the dependency on calibration standards, simplifying experimental workflows.
  • Reference-free μXRF is a powerful tool for materials research, particularly in fields like semiconductor analysis.