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A correction procedure for secondary scattering contributions from windows in small-angle X-ray scattering and
William Chèvremont1, Theyencheri Narayanan1
1ESRF - The European Synchrotron, 71 Avenue des Martyrs, 38043 Grenoble, France.
Abstract:
This article describes a correction procedure for the removal of indirect background contributions to measured small-angle X-ray scattering patterns. The high scattering power of a sample in the ultra-small-angle region may serve as a secondary source for a window placed in front of the detector. The resulting secondary scattering appears as a sample-dependent background in the measured pattern that cannot be directly subtracted. This is an intricate problem in measurements at ultra-low angles, which can significantly reduce the useful dynamic range of detection. Two different procedures are presented to retrieve the real scattering profile of the sample.
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