Fast kV-switching and dual-layer flat-panel detector enabled cone-beam CT joint spectral imaging

Hao Zhou1,2, Li Zhang1,2, Zhilei Wang1,2

  • 1Department of Engineering Physics, Tsinghua University, Beijing, 100084, People's Republic of China.

PubMed
Summary

This study introduces a novel joint spectral imaging solution for cone-beam CT (CBCT) using fast kV-switching (FKS) and dual-layer flat-panel detector (DL-FPD) technologies. The developed system significantly improves material discrimination and reduces artifacts, enhancing image quality.