Harnessing III-Nitride Built-In Field in Multi-Quantum Well LEDs
Mikołaj Chlipała1, Henryk Turski1,2
1Institute of High Pressure Physics, Polish Academy of Sciences, Sokołowska 29/37, 01-142 Warsaw, Poland.
ACS Applied Materials & Interfaces
|April 26, 2024
Summary
Investigating gallium nitride (GaN) light-emitting diodes (LEDs), this study compares "p-up" and "p-down" configurations. "P-down" LEDs show improved carrier transport limited by QW interfaces and achieve lower turn-on voltages.
Area of Science:
- Semiconductor physics
- Materials science
- Optoelectronics
Background:
- III-nitride materials, like gallium nitride (GaN), are crucial for light-emitting devices.
- The wurtzite crystal structure in III-nitrides causes significant polarization fields.
- These fields, coupled with high acceptor ionization energy, hinder carrier injection and distribution in quantum well (QW) LEDs.
Purpose of the Study:
- To investigate and compare carrier distribution in Ga-polar LEDs.
- To analyze two configurations: standard "p-up" and inverted "p-down" using a bottom-tunnel junction.
- To understand the impact of inverted layer sequences on carrier transport and device performance.
Main Methods:
- Fabrication and characterization of Ga-polar LEDs in "p-up" and "p-down" configurations.
- Utilizing a bottom-tunnel junction to invert the p- and n-layer sequence.
- Employing color-coded, alternating quantum wells (QWs) to probe carrier distribution.
Main Results:
- Carrier transport in "p-down" LEDs is limited by the potential barrier at the QW interface.
- In contrast, hole mobility is identified as the bottleneck for carrier transport in "p-up" structures.
- "P-down" LED configurations demonstrate a significantly reduced turn-on voltage.
Conclusions:
- The "p-down" configuration offers an effective strategy to mitigate carrier transport issues in III-nitride LEDs.
- Inverted structures can overcome limitations associated with inherent polarization fields.
- The observed low turn-on voltage in "p-down" LEDs suggests potential for enhanced device efficiency.
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