Diffraction-based approach for real-time monitoring of nanosecond direct laser interference patterning structure...

Direct Laser Interference Patterning (DLIP) stands out as a versatile and cost-effective method for functionalizing material surfaces at high throughputs. Monitoring the dynamics of the structure formation can lead to a deeper understanding of the interplay between the main factors governing the process and ultimately to optimize the final texture. Here, the formation of gratings on stainless steel by DLIP with ns-pulses is studied using a diffraction-based approach, which measures the time-resolved reflectivity (TRR) of the sample. Measurements are performed for single pulses across different laser fluences. The melting dynamics are analyzed and compared with numerical results. By correlating the recorded signals with the structure depths, growth rates of 11 nm/ns and 57 nm/ns were estimated for fluences of 1.9 J/cm² and 5.3 J/cm², respectively. Furthermore, two growth regimes are identified. In the fast growth phase, the melting time increased from 73 to 380 ns for fluences of 1.9 J/cm² and 5.9 J/cm², respectively, showing a good agreement with the performed thermal simulations.