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Measurements of Strain01:27

Measurements of Strain

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Strain quantifies the deformation of a material under force, typically measured as normal strain, which represents the change in length when compared with the original length. Electrical strain gauges are used for enhanced accuracy. These devices consist of a conductive wire mounted on a paper backing that adheres to the material's surface. These gauges operate on the piezoresistive effect, where the wire's electrical resistance changes in response to mechanical deformation. The strain...
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Related Experiment Video

Updated: Jun 26, 2025

Micro/Nano-scale Strain Distribution Measurement from Sampling Moir&#233; Fringes
06:56

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

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Grating (Moiré) Microinterferometric Displacement/Strain Sensor with Polarization Phase Shift.

Leszek Sałbut1, Dariusz Łukaszewski1, Aleksandra Piekarska1

  • 1Warsaw University of Technology, 00-661 Warsaw, Poland.

Sensors (Basel, Switzerland)
|May 11, 2024
PubMed
Summary
This summary is machine-generated.

This study modifies a waveguide interferometer for grating interferometry, enabling automatic fringe pattern analysis through polarization fringe phase shifting for precise in-plane displacement and strain measurement.

Keywords:
displacement measurementgrating (moiré) interferometrypolarization fringe phase shiftwaveguide sensor

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Area of Science:

  • Optics and Photonics
  • Mechanical Engineering
  • Materials Science

Background:

  • Grating (moiré) interferometry is a key technique for full-field in-plane displacement and strain measurement.
  • Conventional waveguide interferometer heads have limitations in automatic fringe pattern analysis.

Purpose of the Study:

  • To propose and verify a modified waveguide interferometer head for grating interferometry.
  • To enable automatic fringe pattern analysis using polarization fringe phase shift.
  • To demonstrate in-plane displacement/strain sensing with the modified head.

Main Methods:

  • Theoretical analysis of a modified waveguide interferometer head.
  • Implementation of polarization fringe phase shift for fringe analysis.
  • Experimental verification of the proposed interferometer design.
  • Concept demonstration for in-plane displacement/strain sensing.

Main Results:

  • Successful modification of a conventional waveguide interferometer head.
  • Demonstration of polarization fringe phase shift for automatic analysis.
  • Experimental validation of the theoretical considerations.
  • Proof of concept for in-plane displacement/strain sensing.

Conclusions:

  • The proposed modification enhances grating interferometry by enabling automatic fringe pattern analysis.
  • The modified waveguide interferometer head is effective for precise in-plane displacement and strain measurements.
  • This advancement offers a more efficient approach to optical metrology.