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Related Experiment Video

Updated: Jun 25, 2025

Finite Element Modelling of a Cellular Electric Microenvironment

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Published on: May 18, 2021

A Study on the Frequency-Domain Black-Box Modeling Method for the Nonlinear Behavioral Level Conduction Immunity of

Xi Chen¹, Shuguo Xie¹, Mengyuan Wei¹

¹School of Electronic and Information Engineering, Beihang University, Beijing 100191, China.

|May 25, 2024

Summary

This study introduces Sensi-Freq-Model, a novel frequency-domain approach for integrated circuit (IC) conduction susceptibility. This method significantly reduces modeling time and enhances accuracy for broadband immunity assessments.

Keywords:

X-parameters direct power injection (DPI)electromagnetic compatibility (EMC) modeling immunity modeling integrated circuit (IC)models of integrated circuits for RF immunity behavioral simulation-conducted immunity modeling (ICIM-CI)

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Published on: February 8, 2011

Area of Science:

Electrical Engineering
Electromagnetic Compatibility
Semiconductor Device Modeling

Background:

Traditional black-box modeling for circuit conduction immunity, such as time-domain methods or ICIM-CI models, suffers from extensive testing requirements, long modeling times, and poor accuracy in frequency-domain analysis.
Existing methods struggle to capture complex electromagnetic responses and lack reproducibility, hindering efficient broadband immunity assessments.

Purpose of the Study:

To develop a novel frequency-domain broadband model for integrated circuit (IC) conduction susceptibility, named Sensi-Freq-Model.
To accurately quantify component conduction immunity in the frequency domain and improve the accuracy of circuit broadband design.

Main Methods:

Proposed a new frequency-domain broadband model (Sensi-Freq-Model) for IC conduction susceptibility.
Quantified conduction immunity data in the frequency domain to build the IC model.
Focused on retaining frequency-domain broadband information for enhanced model portability and repeatability.

Main Results:

The Sensi-Freq-Model demonstrates high fitting accuracy in the frequency domain.
Achieved a significant reduction in broadband modeling time, approximately 90% compared to traditional ICIM-CI methods.
Improved the normalized mean square error (NMSE) by 18.5 dB, indicating enhanced accuracy.

Conclusions:

The Sensi-Freq-Model offers a more efficient and accurate approach to assessing IC conduction susceptibility.
The model enhances portability and repeatability by reducing the need for model rebuilding under varying electromagnetic environments.
This advancement significantly improves modeling efficiency and supports more accurate circuit broadband design.