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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Dennis Stiegekötter1, Jens Pogorzelski1, Ludwig Horsthemke1
1Department of Electrical Engineering and Computer Science, FH Münster-University of Applied Sciences, Stegerwaldstraße 39, 48565 Steinfurt, Germany.
This study presents cost-effective electronics for controlling nitrogen-vacancy (NV) centers using microcontrollers. This enables precise manipulation of NV electron spins for quantum applications, even in educational settings.
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