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Parameter selection on a multi-exposure fusion method for measuring surfaces with varying reflectivity in microscope
Applied Optics
|June 10, 2024
Summary
This study enhances 3D surface measurement using an improved multi-exposure fusion method with guided parameter selection. It significantly boosts measurement completeness for high-dynamic surfaces, achieving over 99% restoration coverage.
Area of Science:
- Metrology
- Optical Measurement
- Surface Characterization
Background:
- Accurate three-dimensional (3D) shape and surface measurement is crucial for advancing industries and scientific research.
- Measuring surfaces with varying reflectivity presents significant challenges in 3D reconstruction.
- Existing multi-exposure fusion methods offer high-quality results but rely on experience-based parameter selection.
Purpose of the Study:
- To improve the multi-exposure fusion method for enhanced 3D measurement accuracy and completeness.
- To introduce a guided approach for selecting optimal parameters in multi-exposure fusion.
- To experimentally validate the influence of key parameters on 3D reconstruction integrity.
Main Methods:
- Development of an improved multi-exposure fusion algorithm.
- Introduction of a guided parameter selection strategy.
- Creation of a comparative model to analyze Gaussian window variance, optimal grayscale range, and attenuation factor variance.
- Experimental validation on high-dynamic surfaces.
Main Results:
- The guided parameter selection significantly enhances the completeness of 3D measurement results.
- Experimental validation confirmed the impact of Gaussian window variance, optimal grayscale range, and attenuation factor variance.
- Restoration coverage for high-dynamic surfaces improved from 86% (bright areas) and 50% (dark areas) to over 99%.
Conclusions:
- The proposed guided parameter adjustment method optimizes multi-exposure fusion for precise 3D measurements.
- This approach effectively addresses challenges in measuring surfaces with varying reflectivities.
- The study provides a robust strategy for parameter selection in multi-exposure based 3D metrology.

